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IEC 60147-2L:1979 ED1

Supplement L - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Chapter 6: Digital integrated circuits IEC 60147-2L:1979 ED1

Publication date:   Jan 1, 1979

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99.60 Withdrawal effective   Nov 19, 2016

IEC

TC 47

International Standard

31.080.10   Diodes

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WITHDRAWN
IEC 60147-2L:1979 ED1
99.60 Withdrawal effective
Nov 19, 2016

REVISED BY

WITHDRAWN
IEC 60748-2:1985 ED1