IEC 60147-2C:1970 ED1

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Publication date:   Jan 1, 1970

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high-
frequency parameters.

Life cycle

NOW

WITHDRAWN
IEC 60147-2C:1970 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-2C ED2