IEC 60147-2C:1970 ED1

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods IEC 60147-2C:1970 ED1

Publication date:   Jan 1, 1970

Scope

Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high-
frequency parameters.