Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
WITHDRAWN
IEC 60147-2:1963 ED1
95.99
Withdrawal of Standard
Mar 31, 1995
ABANDON
IEC 60147-2 ED2