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IEC 60147-2:1963 ED1

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods IEC 60147-2:1963 ED1

Publication date:   Jan 1, 1963

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.

Life cycle

NOW

WITHDRAWN
IEC 60147-2:1963 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-2 ED2




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