IEC 60147-0F:1982 ED1

Supplement F - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Publication date:   Jan 1, 1982

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Applies to the storage, transport, handling and testing of electrostatic sensitive devices: the discharge of electrostatic energy from unearthed equipment or operators produces voltages that could destroy the device, even if the device contains protection circuits.

Life cycle

NOW

WITHDRAWN
IEC 60147-0F:1982 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-0F ED2