IEC 60147-0F:1982 ED1

Supplement F - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology IEC 60147-0F:1982 ED1

Publication date:   Jan 1, 1982

Scope

Applies to the storage, transport, handling and testing of electrostatic sensitive devices: the discharge of electrostatic energy from unearthed equipment or operators produces voltages that could destroy the device, even if the device contains protection circuits.