Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
WITHDRAWN
IEC 60115-1:1982 ED2
WITHDRAWN
IEC 60115-1:1982/AMD2:1987 ED2
WITHDRAWN
IEC 60115-1:1982/AMD3:1989 ED2
WITHDRAWN
IEC 60115-1:1982/AMD4:1993 ED2
WITHDRAWN
IEC 60115-1:1982/AMD1:1983 ED2
WITHDRAWN
IEC 60115-1:1999 ED3
99.60
Withdrawal effective
Jul 21, 2008
WITHDRAWN
IEC 60115-1:1999/AMD1:2001 ED3
WITHDRAWN
IEC 60115-1:2008 ED4