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IEC 60068-2-29:1968/AMD1:1982 ED1

amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump

Publication date:   Nov 30, 1982

General information

99.60 Withdrawal effective   Nov 19, 2016

IEC

TC 104

International Standard

19.040   Environmental testing

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Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60068-2-29:1968 ED1

NOW

WITHDRAWN
IEC 60068-2-29:1968/AMD1:1982 ED1
99.60 Withdrawal effective
Nov 19, 2016

REVISED BY

WITHDRAWN
IEC 60068-2-29:1987 ED2