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FprEN IEC 63287-4:2026

Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment FprEN IEC 63287-4:2026

Publication date:   Jun 19, 2026

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50.60   Close of voting. Proof returned by secretariat   Jul 31, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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FprEN IEC 63287-4:2026
50.60 Close of voting. Proof returned by secretariat
Jul 31, 2026




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