Menu

0

EN ISO 18452:2016

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

Publication date:   Jul 18, 2016

General information

60.60 Standard published   Apr 20, 2016

CEN

CEN/TC 184 Advanced technical ceramics

European Norm

81.060.30   Advanced ceramics

Buying

  Published

PDF - €26.80

  English  



Buy

Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 1071-1:2003

NOW

PUBLISHED
EN ISO 18452:2016
60.60 Standard published
Apr 20, 2016

Relations

Adopted from ISO 18452:2005 IDENTICAL