EN ISO 16526-1:2020

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method (ISO 16526-1:2011) EN ISO 16526-1:2020

Publication date:   Jul 15, 2020

General information

60.60 Standard published   Mar 4, 2020

CEN

CEN/TC 138 Non-destructive testing

European Norm

19.100   Non-destructive testing

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Published

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Scope

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 12544-3:1999

WITHDRAWN
EN 12544-1:1999

WITHDRAWN
EN 12544-2:2000

NOW

PUBLISHED
EN ISO 16526-1:2020
60.60 Standard published
Mar 4, 2020

Relations

Adopted from ISO 16526-1:2011 IDENTICAL