60.60 Standard published Jan 16, 2026
CENELEC
CLC/SR 46F RF and microwave passive components
European Norm
17.220.20 Measurement of electrical and magnetic quantities | 29.050 Superconductivity and conducting materials
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
PUBLISHED
EN IEC 63616:2026
60.60
Standard published
Jan 16, 2026