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EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method EN IEC 63616:2026

Publication date:   Mar 17, 2026

General information

60.60   Standard published   Jan 16, 2026

CENELEC

CLC/SR 46F RF and microwave passive components

European Norm

17.220.20   Measurement of electrical and magnetic quantities | 29.050   Superconductivity and conducting materials

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IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

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PUBLISHED
EN IEC 63616:2026
60.60 Standard published
Jan 16, 2026




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