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EN IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors EN IEC 62969-4:2018

Publication date:   Feb 14, 2019

General information

60.60 Standard published   Aug 24, 2018

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.99   Other semiconductor devices

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Scope

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

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PUBLISHED
EN IEC 62969-4:2018
60.60 Standard published
Aug 24, 2018