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EN IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors EN IEC 62969-4:2018

Publication date:   Feb 14, 2019

General information

90.93   Standard confirmed   Dec 15, 2025

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

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Scope

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Life cycle

NOW

PUBLISHED
EN IEC 62969-4:2018
90.93 Standard confirmed
Dec 15, 2025




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