EN IEC 61967-8:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

Publication date:   Oct 16, 2023

General information

60.60 Standard published   Jun 9, 2023

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

Buying

  Published

PDF - €31.61

  English  



Buy

Scope

<!-- NEW! -->IEC 61967-8:2023 is available as <a href="https://webstore.iec.ch/publication/85173">IEC 61967-8:2023 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:

a) frequency range of 150 kHz to 3 GHz was deleted from the scope;

b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

Related legislation

Legislation related to this standard

2014/30/EU

Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)

Life cycle

PREVIOUSLY

PUBLISHED
EN 61967-8:2011

NOW

PUBLISHED
EN IEC 61967-8:2023
60.60 Standard published
Jun 9, 2023