EN 61967-8:2011

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method EN 61967-8:2011

Publication date:   Dec 16, 2011

General information

99.60   Withdrawal effective   Jun 7, 2026

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

Buying

Withdrawn

Language in which you want to receive the document.

Scope

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with <a href='http://webstore.iec.ch/webstore/webstore.nsf/ArtNum_PK/28581'> IEC 61967-1:2002</a>.

Related legislation

Legislation related to this standard

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

2014/30/EU

Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)

Life cycle

NOW

WITHDRAWN
EN 61967-8:2011
99.60 Withdrawal effective
Jun 7, 2026

REVISED BY

PUBLISHED
EN IEC 61967-8:2023




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.