60.60 Standard published Oct 9, 2020
CENELEC
European Norm
31.080.01 Semiconductor devices in general
Published
<!-- NEW! -->IEC 60749-20:2020 is available as <a href="https://webstore.iec.ch/publication/67549">IEC 60749-20:2020 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the following significant technical changes with respect to the previous edition:
- incorporation of a technical corrigendum to IEC 60749-20:2008 (second edition );
- inclusion of new Clause 3;
- inclusion of explanatory notes.
WITHDRAWN
EN 60749-20:2009
PUBLISHED
EN IEC 60749-20:2020
60.60
Standard published
Oct 9, 2020
