EN 62779-2:2016

Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances EN 62779-2:2016

Publication date:   Aug 16, 2016

General information

90.93   Standard confirmed   Dec 15, 2025

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a signal transmitter is electrically isolated from a signal receiver, so an isolation condition between the transmitter and receiver is maintained to accurately measure the electrode's performances. This part includes general and functional specifications of the measurement method.

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PUBLISHED
EN 62779-2:2016
90.93 Standard confirmed
Dec 15, 2025




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