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EN 62435-5:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices EN 62435-5:2017

Publication date:   Jul 12, 2017

General information

60.60 Standard published   Mar 31, 2017

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.020   Electronic components in general

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IEC 62435-5:2017 is applicable to long-term storage of die and wafer devices and establishes specific storage regimen and conditions for singulated bare die and partial or complete wafers of die including die with added structures such as redistribution layers and solder balls or bumps or other metallisation. This part also provides guidelines for special requirements and primary packaging that contain the die or wafers for handling purposes.  Typically, this part is used in conjunction with <a href="https://webstore.iec.ch/publication/31455">IEC 62435-1:2017</a> for long-term storage of devices whose duration can be more than 12 months for products scheduled for long duration storage.



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PUBLISHED
EN 62435-5:2017
60.60 Standard published
Mar 31, 2017