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EN 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms EN 62435-2:2017

Publication date:   Jul 12, 2017

General information

60.60 Standard published   Apr 28, 2017

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.020   Electronic components in general

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Scope

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with <a href="https://webstore.iec.ch/publication/31455">IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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PUBLISHED
EN 62435-2:2017
60.60 Standard published
Apr 28, 2017