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EN 62433-3:2017

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE) EN 62433-3:2017

Publication date:   Aug 17, 2017

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60.60 Standard published   Jun 2, 2017

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics | 33.100.10   Emission

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<p class="PARAGRAPH">
IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE.  The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.<o:p></o:p>

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EN 62433-3:2017
60.60 Standard published
Jun 2, 2017