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EN 62228-2:2017

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers EN 62228-2:2017

Publication date:   May 15, 2017

General information

60.60 Standard published   Feb 3, 2017

CENELEC

CLC/SR 47A Integrated circuits

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:

- the emission of RF disturbances,

- the immunity against RF disturbances,

- the immunity against impulses and

- the immunity against electrostatic discharges (ESD).

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PUBLISHED
EN 62228-2:2017
60.60 Standard published
Feb 3, 2017