EN 62132-3:2007

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method EN 62132-3:2007

Publication date:   Jun 26, 2008

General information

99.60 Withdrawal effective   Oct 13, 2021

CENELEC

CLC/SR 47A Integrated circuits

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.

Related legislation

Legislation related to this standard

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

2014/30/EU

Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)

Life cycle

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WITHDRAWN
EN 62132-3:2007
99.60 Withdrawal effective
Oct 13, 2021