60.60 Standard published Sep 27, 2013
CENELEC
CLC/SR 47F Micro-electromechanical systems
European Norm
31.080.99 Other semiconductor devices
Published
IEC 62047-18:2013 specifies the method for bend testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 micrometre and 10 micrometre. This International Standard specifies the bend testing and test piece shape for micro-sized smooth cantilever type test pieces, which enables a guarantee of accuracy corresponding to the special features.
PUBLISHED
EN 62047-18:2013
60.60
Standard published
Sep 27, 2013