60.60 Standard published Jul 10, 2015
CENELEC
CLC/SR 47F Micro-electromechanical systems
European Norm
31.080.99 Other semiconductor devices
Published
IEC 62047-16:2015 specifies the test methods to measure the residual stresses of films with thickness in the range of 0,01 μ to 10 μ in MEMS structures fabricated by wafer curvature or cantilever beam deflection methods.
PUBLISHED
EN 62047-16:2015
60.60
Standard published
Jul 10, 2015