60.60 Standard published Oct 14, 2011
CENELEC
European Norm
31.200 Integrated circuits. Microelectronics
IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with <a href='http://webstore.iec.ch/webstore/webstore.nsf/ArtNum_PK/28581'> IEC 61967-1:2002</a>.
Legislation related to this standard
Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
PUBLISHED
EN 61967-8:2011
60.60
Standard published
Oct 14, 2011
PUBLISHED
EN IEC 61967-8:2023