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EN 60749-8:2003

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing EN 60749-8:2003

Publication date:   Dec 22, 2003

General information

60.60   Standard published   Jun 20, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

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PUBLISHED
EN 60749-8:2003
60.60 Standard published
Jun 20, 2003




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