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EN 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state EN 60749-36:2003

Publication date:   Dec 22, 2003

General information

60.60   Standard published   Apr 17, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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PUBLISHED
EN 60749-36:2003
60.60 Standard published
Apr 17, 2003




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