EN 60749-29:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test EN 60749-29:2003

Publication date:   Jul 30, 2004

Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.