EN 60749-18:2003

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) EN 60749-18:2003

Publication date:   Dec 22, 2003

General information

99.60 Withdrawal effective   May 15, 2022

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Life cycle

NOW

WITHDRAWN
EN 60749-18:2003
99.60 Withdrawal effective
May 15, 2022

REVISED BY

PUBLISHED
EN IEC 60749-18:2019