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EN 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation EN 60749-17:2003

Publication date:   Dec 22, 2003

General information

99.60   Withdrawal effective   May 2, 2022

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
EN 60749-17:2003
99.60 Withdrawal effective
May 2, 2022

REVISED BY

PUBLISHED
EN IEC 60749-17:2019




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