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EN 60749-16:2003

Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

Publication date:   Dec 22, 2003

General information

60.60   Standard published   Apr 3, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).

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PUBLISHED
EN 60749-16:2003
60.60 Standard published
Apr 3, 2003