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EN 60444-6:2013

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) EN 60444-6:2013

Publication date:   Dec 17, 2013

General information

60.60 Standard published   Oct 4, 2013

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

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Scope

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60444-6:1997

NOW

PUBLISHED
EN 60444-6:2013
60.60 Standard published
Oct 4, 2013

REVISED BY

PUBLISHED
EN IEC 60444-6:2021