IEC 60748-20-1:1994 ED1

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination IEC 60748-20-1:1994 ED1

Publication date:   Mar 1, 1994

General information

60.60 Standard published   Mar 1, 1994


TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics



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The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

Life cycle


IEC 60748-20-1:1994 ED1
60.60 Standard published
Mar 1, 1994