IEC 60748-20:1988 ED1

Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits IEC 60748-20:1988 ED1

Publication date:   Jun 30, 1988

General information

60.60 Standard published   Jun 30, 1988

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

Buying

Published

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Scope

Applies to film integrated circuits and to hybrid film integrated circuits both passive and active. Applies also to partly-completed F and HFICs supplied to customers for subsequent processing as well as to chip carrier circuits having more than one chip, provided that they have been interconnected by film interconnection techniques. This specification defines the quality assessment procedures and the methods for electrical, climatic, mechanical and endurance tests. It outlines the requirements which shall be applied to the release of circuits using either qualification approval procedures or capability approval procedures.

Life cycle

NOW

PUBLISHED
IEC 60748-20:1988 ED1
60.60 Standard published
Jun 30, 1988

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 60748-20:1988/AMD1:1995 ED1

REVISED BY

ABANDON
IEC 60748-20 ED2