60.60 Standard published Feb 7, 2020
IEC
International Standard
31.080.01 Semiconductor devices in general
Published
IEC 60747-18-2:2020(E) specifies the evaluation process of lens-free CMOS photonic array sensor package modules. This document includes the measurement environment of each process, statistical analysis of test data, middle layer effect under various user light, evaluation of calibrated lens-free CMOS photonic array sensor package modules, and test report.
PUBLISHED
IEC 60747-18-2:2020 ED1
60.60
Standard published
Feb 7, 2020