IEC 60749-27:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publication date:   Oct 21, 2003

General information

99.60 Withdrawal effective   Jul 18, 2006

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Life cycle

PREVIOUSLY

Replaces
IEC PAS 62180:2000 ED1

NOW

WITHDRAWN
IEC 60749-27:2003 ED1
99.60 Withdrawal effective
Jul 18, 2006

REVISED BY

PUBLISHED
IEC 60749-27:2006 ED2