IEC 60749-27:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) IEC 60749-27:2003 ED1

Publication date:   Oct 21, 2003

Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the human body model (see IEC 60749-26).