IEC 60749-1:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publication date:   Aug 30, 2002

General information

60.60 Standard published   Aug 30, 2002

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

Buying

Published

Language in which you want to receive the document.

Scope

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

PUBLISHED
IEC 60749-1:2002 ED1
60.60 Standard published
Aug 30, 2002

CORRIGENDA / AMENDMENTS

Corrected by
IEC 60749-1:2002/COR1:2003 ED1