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IEC PAS 62189:2000 ED1

Bias Life IEC PAS 62189:2000 ED1

Publication date:   Nov 28, 2000

General information

99.60 Withdrawal effective   Feb 23, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Life cycle

NOW

WITHDRAWN
IEC PAS 62189:2000 ED1
99.60 Withdrawal effective
Feb 23, 2004

REVISED BY

PUBLISHED
IEC 60749-23:2004 ED1