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IEC PAS 62185:2000 ED1

Thermal shock test method IEC PAS 62185:2000 ED1

Publication date:   Aug 22, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

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Scope

This test is conducted to determine the resistance of a part to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.

Life cycle

NOW

WITHDRAWN
IEC PAS 62185:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

PUBLISHED
IEC 60749-11:2002 ED1