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Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests - Test 2f: Housing (shell) electrical continuity

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal)

60.60 Standard published

CLC/SR 48B

Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)

60.60 Standard published

CLC/SR 48B

Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free connectors) - Test 7b: Mechanical strength impact

60.60 Standard published

CLC/SR 48B