Standards search

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Smart manufacturing standards map (SM2) - Part 2: Catalogue

60.60 Standard published

SyC SM

Digital Test Interchange Format (DTIF)

60.60 Standard published

TC 91

Delay and power calculation standards - Part 1: Integrated Circuit (IC) Open Library Architecture (OLA)

60.60 Standard published

TC 91

Corrigendum 1 - Delay and power calculation standards - Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems

60.60 Standard published

TC 91

Delay and power calculation standards - Part 4: Design and Verification of Low-Power, Energy-Aware Electronic Systems

60.60 Standard published

TC 91

Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

60.60 Standard published

TC 91

Software Interface for Maintenance Information Collection and Analysis (SIMICA)

60.60 Standard published

TC 91

Software Interface for Maintenance Information Collection and Analysis (SIMICA) - Part 2: Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

60.60 Standard published

TC 91

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

60.60 Standard published

TC 91

Behavioural languages - Part 1-1: VHDL Language Reference Manual

60.60 Standard published

TC 91

Behavioural languages - Part 6: VHDL Analog and Mixed-Signal Extensions

60.60 Standard published

TC 91

Behavioural languages - Part 7: SystemC R Language Reference Manual

60.60 Standard published

TC 91

Behavioural languages - Part 8: Standard SystemC Analog/Mixed-Signal Extensions Language Reference Manual

60.60 Standard published

TC 91

IP-XACT, Standard Structure for Packaging, Integrating, and Reusing IP within Tool Flows

60.60 Standard published

TC 91

Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs

60.60 Standard published

TC 91

Standard Test Interface Language (STIL) for Digital Test Vector Data

60.60 Standard published

TC 91

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

60.60 Standard published

TC 91

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

60.60 Standard published

TC 91