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Connectors for electronic equipment - Tests and measurements - Part 21-1: R.F. resistance tests - Test 21a: R.F. shunt resistance
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 2-2: Electrical continuity and contact resistance tests - Test 2b: Contact resistance - Specified test current method
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests - Test 2c: Contact resistance variation
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 23-2: Screening and filtering tests - Test 23b: Suppression characteristics of integral filters
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests - Test 23d: Transmission line reflections in the time domain
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 23-7: Screening and filtering tests - Test 23g: Effective transfer impedance of connectors
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a - Crosstalk ratio
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss)
60.60 Standard published
Connectors for electronic equipment - Tests and measurement - Part 25-3: Test 25c - Rise time degradation
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-4: Teste25d - Propagation delay
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g - Impedance, reflection coefficient and voltage standing wave ratio (VSWR)
60.60 Standard published
Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk
60.60 Standard published
