Projects

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

60.60 Standard published

TC 47/SC 47E

Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

40.20 DIS ballot initiated: 12 weeks

TC 47/SC 47E

Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 6: Discrete devices - Thyristors

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 6: Discrete devices - Thyristors

30.99 CD approved for registration as DIS

TC 47/SC 47E

Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors

60.60 Standard published

TC 47/SC 47E

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies

60.60 Standard published

TC 47/SC 47E

Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation

60.60 Standard published

TC 47/SC 47E

Test method of sound variation detection sensors for fire detection

00.99 Approval to ballot proposal for new project

TC 47/SC 47E