Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
60.60 Standard published
Synthetic quartz crystal - Specifications and guidelines for use
60.60 Standard published
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
60.60 Standard published
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
60.60 Standard published
Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
60.60 Standard published
Surface acoustic wave (SAW) resonators - Part 1: Generic specification
60.60 Standard published
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
60.60 Standard published
Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
60.60 Standard published
Guide to the measurement of equivalent electrical parameters of quartz crystal units
60.60 Standard published
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
60.60 Standard published
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
60.60 Standard published
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
60.60 Standard published
Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
60.60 Standard published
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
60.60 Standard published
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
60.60 Standard published
Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
60.60 Standard published
Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
60.60 Standard published
Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
60.60 Standard published
