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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

60.60 Standard published

CLC/SR 49

Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

60.60 Standard published

CLC/SR 49

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

60.60 Standard published

CLC/SR 49

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

60.60 Standard published

CLC/SR 49

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

60.60 Standard published

CLC/SR 49

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

60.60 Standard published

CLC/SR 49

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

60.60 Standard published

CLC/SR 49

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

60.60 Standard published

CLC/SR 49

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

60.60 Standard published

CLC/SR 49

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval

60.60 Standard published

CLC/SR 49

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

60.60 Standard published

CLC/SR 49

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

60.60 Standard published

CLC/SR 49

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

60.60 Standard published

CLC/SR 49

Synthetic quartz crystal - Specifications and guidelines for use

60.60 Standard published

CLC/SR 49

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

60.60 Standard published

CLC/SR 49

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

60.60 Standard published

CLC/SR 49

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

60.60 Standard published

CLC/SR 49

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

60.60 Standard published

CLC/SR 49