Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.
Nanomanufacturing – Key control characteristics – Part 10–1: Nanoelectronic products – Impedance: scanning microwave microscopy
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 10-2: Nanoelectronic products - Current, resistance: conductive probe atomic force microscopy
20.99 WD approved for registration as CD
Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:
90.93 Standard confirmed
Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
60.60 Standard published
IEC TS 62607-2-1 ED2: Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance: Four terminal method
20.99 WD approved for registration as CD
IEC TS 62607-2-2: Nanomanufacturing - Key control characteristics - Part 2-2: Nanomaterials - EM Shielding Effectiveness measurement for Near Field
50.00 Final text received or FDIS registered for formal approval
Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-6: Carbon nanotube-related products - Thermal diffusivity of vertically-aligned carbon nanotubes: flash method
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
62607-2-7: Nanomanufacturing - Key control characteristics - Part 2-7: Single wall carbon nanotubes - Semiconducting/metallic-ratio: Optical spectroscopy
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage - Thermal characterization of nanomaterials, nail penetration method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterization, 3-electrode cell method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-6: Nano-enabled electrical energy storage devices - Determination of carbon content for nano electrode materials, infrared absorption method
60.60 Standard published
