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RF & DC lines cabling components for quantum technologies down to ultra-low temperature – Key parameters and test methods

Scope

The proposed activity includes:
- Identification and definition of the key parameters and quantities of interest for cabling components used in control / measurement
highways, in view of accommodating the needs and requirements of quantum technologies applications at low temperature, whether
in the DC or RF domain. These cabling components includes cables, connectors and other connection solutions integrating further
functionalities (filters, attenuators...).
- Define the different methods for measuring these parameters and quantities, and their suitability to the cryogenic vacuum
environment. This makes it possible to identify a reference methodology for measuring each parameter.
- Identification of the tools and equipment needed to measure these parameters and quantities (refrigerators, VNA, thermometers, etc.).
- Data analysis, to some extent.
At the time of writing, the identified parameters of interest include but are not limited to:
1. Reverse gain, insertion loss or transmission phase (i.e. S12) [dB] vs frequency [Hz] vs temperature [K],
2. Forward gain, insertion loss or transmission phase (i.e. S21) [dB] vs frequency [Hz] vs temperature [K],
3. Input reflection coefficient, return loss, VSWR (i.e. S11) [dB] vs frequency [Hz] vs temperature [K],
4. Output reflection coefficient, return loss, VSWR (i.e. S22) [dB] vs frequency [Hz] vs temperature [K],
5. Impedance [Ohm] vs temperature [K],
6. Operating frequencies bandwith [Hz],
7. Linear capacitance [pF/m],
8. Thermal resistance [K/W] and conductance [W/K]
9. Operating temperature [K]
10. Dimensions, shape and associated tolerance [mm]
11. Stabilization time [ms] after thermalization (e.g. after DC or RF pulse)
12. Screening effectiveness [dB] vs frequency [Hz]
13. Crosstalk [dB] vs frequency [Hz]
14. Ageing: RF performance conservation (1, 2, 3, 4, 12, 13) after [nb] of temperature cycling
Mechanical robustness againstvibrations and mechanical stress (under vacuum, at low temperature),immunity against magnetic field, IR and thermal radiation could also be considered if needed.
The work item does not aim at specifying numerical values of the parameters of interest because they will depend on quantum technologies used.