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prEN IEC 63551-6:2026

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 6: Visual imaging devices prEN IEC 63551-6:2026

Publication date:   Jul 17, 2026

General information

40.20   DIS ballot initiated: 12 weeks   Jul 17, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.99   Other semiconductor devices

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prEN IEC 63551-6:2026
40.20 DIS ballot initiated: 12 weeks
Jul 17, 2026




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